ENGMP516-19B (HAM)

Materials Characterisation

15 Points

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Division of Health Engineering Computing & Science
School of Engineering

Staff

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Convenor(s)

Leandro Bolzoni

Leandro Bolzoni
9381
LSL.1.20
To be advised
leandro.bolzoni@waikato.ac.nz

Lecturer(s)

Kim Pickering

Kim Pickering
4672
CD.3.03
To be advised
kim.pickering@waikato.ac.nz

Rob Torrens

Rob Torrens
4684
LSL.1.18
Appointments are best arranged in advance via email.
rob.torrens@waikato.ac.nz

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: mary.dalbeth@waikato.ac.nz

Placement Coordinator(s)

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Student Representative(s)

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Librarian(s)

: debby.dada@waikato.ac.nz

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Paper Description

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This 15 points paper covers the basic theory and use of advanced analytical techniques used in materials characterization including optical microscopy, x-ray diffraction, scanning electron microscopy (SEM), transmission electron microscopy (TEM) and differential thermal analysis (DTA).

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Paper Structure

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This paper is taught by directed study and coursework exercises.

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Learning Outcomes

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Students who successfully complete the course should be able to:

  • Comprehend the underlying principles of optical microscopy for its use in the field of materials science.
    Linked to the following assessments:
  • Evaluate the results obtained via Scanning Electron Microscopy (SEM) and the associated Energy Dispersive X-ray analysis (EDX) as per their respective operating principles.
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  • Analyse X-ray Diffraction (XRD) spectra on the basis of the theory supporting XRD analysis.
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  • Comprehend the principles and theory of Differential Thermal Analysis (DTA) and interpret typical data from this technique.
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  • Analysis TEM data and evaluate the results obtained depending on the TEM operation mode.
    Linked to the following assessments:
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Assessment

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Internal assessment: 20%

Final exam: 80%

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Assessment Components

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The internal assessment/exam ratio (as stated in the University Calendar) is 20:80. There is no final exam. The final exam makes up 80% of the overall mark.

The internal assessment/exam ratio (as stated in the University Calendar) is 20:80 or 0:0, whichever is more favourable for the student. The final exam makes up either 80% or 0% of the overall mark.

Component DescriptionDue Date TimePercentage of overall markSubmission MethodCompulsory
1. Assignment on XRD
26 Jul 2019
12:00 PM
5
2. Assignment on LOM/SEM
16 Aug 2019
12:00 PM
5
3. Assignment on TEM
20 Sep 2019
12:00 PM
5
4. Assignment on DTA
11 Oct 2019
12:00 PM
5
5. Exam
80
✔
Assessment Total:     100    
Failing to complete a compulsory assessment component of a paper will result in an IC grade
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Required and Recommended Readings

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Required Readings

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Lecture Notes provided by the Lecturer responsible for each specific topic.

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Recommended Readings

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Field guide to microscopy, Tkaczyk, Tomasz S (2010)

Principles and techniques of scanning electron microscopy, Hayat, M. A (1974)

Transmission electron microscopy: a textbook for materials science, Williams, David B; Carter, C. Barry (1996)

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Online Support

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Information regarding online support/Moodle will be provided by the lecturers concerned.

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Workload

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This 15pt paper emphasizes on the theories and fundamental principles of materials characterisation.

The paper has a total workload of approx. 150 hours: 110 hours of self-directed study and 40 hours, equally divided, for the four assignments associated with the topics of the papers.

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Linkages to Other Papers

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Prerequisite(s)

Prerequisites: Departmental approval required.

Corequisite(s)

Equivalent(s)

Restriction(s)

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